Film thickness measurement (ellipsometry): View
Film thickness measurement (ellipsometry): View. Process Hierarchy ... Film thickness measurement (ellipsometry) Process characteristics: Film thickness ...
Film thickness measurement (interferometry): View
Film thickness measurement (interferometry): View. Process Hierarchy. Bonding. Clean ... Film material to measure. Sides inspected. The sides of the wafer ...
PPLN Chips for High-volume Green Laser Applications ...
... the growth and production of lithium niobate wafers and a wholly owned ... domains that measure approximately 3.5µm throughout the wafer thickness of 0.5mm. ...
Laser Focus World - May 2006 - Features (Page 89)
... was less than olution of the angle-scan measurements 1. J. Arkwright, I. ... Line scans of the thickness profile rect lithium niobate wafers used for so ...